36. Comparison of intensity profile analysis and correlation function methods for studying the lamellar structures of semicrystalline polymers using small-angle X-ray scattering
作者：Wang ZG, Hsiao BS, Murthy NS
关键字：相关函数法，散射强度法，片晶厚度
论文来源：期刊
具体来源：Journal of Applied Crystallography, 2000, 33 (1), 690-694.
发表时间：2000年
暂无